Stick and Peel PV Probe

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Stick and Peel Probe for Analysis of Defects under Operando Conditions in Perovskite Materials for Manufacturing or Quality Control Tech ID: UA21-145 Invention: A solvent-free, non-destructive, electrochemical probe may be used for analyzing various properties and defects in metal halide perovskite materials such as organic semiconductors, device stacks, photovoltaics, or material blends. This redox probe technology can be used in the manufacturing of perovskite solar cells to improve their performance and robustness. The probe can be used to analyze numerous characteristics, such as a defect, stability, surface composition, band gap, physical structure, electroactivity, band bending, migration/diffusion process, and charging effects. The technology can be incorporated into a material, or used as a removable "stick and peel" probe. Background: Perovskite solar cells represent an emerging category of thin film solar cells with very good prospects for becoming a replacement for not only other thin film solar technologies, but also as a substitute for crystalline silicon. Their efficiency has grown rapidly in a short time, leading to the conclusion that very high efficiencies can be achieved, higher than what is theoretically possible for other types of solar cells. The issue that these cells face are a short life span as they decrease in efficiency quickly compared to more traditional methods of harvesting solar energy. This tech has the ability to bring more understanding of the defect formation in perovskite films manufacturing, ultimately improving the stability and life span of thin film perovskite solar cells.