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SCANNING PROBE MICROSCOPE COMBINED WITH A DEVICE FOR MODIFYING THE SURFACE OF AN OBJECT
About
The invention relates to devices for monitoring objects after nano-cutting and for investigating the structures of macro- and micro-carriers under low temperature conditions. The present microscope comprises a punch having a cutting edge, drives which drive the punch along two axes, a platform which can rotate in a plane, a piezo-scanner which can record a sample image along three axes, a holder with a carrier of the sample under investigation, and a probe unit to which a probe is fastened. The piezo-scanner is fastened to the platform, the punch is arranged so as to be able to interact with the sample under investigation, and the probe unit is mounted on the platform so as to be movable along one of the axes. Furthermore, the assembly additionally includes a module for mechanical action on the cutting edge of the punch in order to modify the cutting surface thereof, wherein the above-mentioned module for mechanical action is fastened to the same platform to which the piezo-scanner with the carrier of the object under investigation and the probe unit are fastened. The proposed invention makes it possible to increase the quality of the image of the sample under investigation.
Key Benefits
The proposed invention makes it possible to increase the quality of the image of the sample under investigation.
Applications
A scanning probe microscope combined with a device for modifying the surface of an object refers to a measuring technique, in particular, to devices for measuring probe objects by objects after nanotomy and to investigate the structures of macro- and microcarriers at low temperatures.